Key Selection Information
| Selection Parameter | Confirmed Information |
|---|---|
| Function | Logarithmic RF detector/controller |
| Frequency range | 1 MHz to 10 GHz useful operation |
| Accurate log conformance | To 8 GHz |
| Dynamic range | 55 dB with <±3 dB error through 8 GHz |
| Log slope | Approximately -22 mV/dB |
| Pulse response | 6 ns / 10 ns fall/rise |
| Supply | 3.0 V to 5.5 V at 22 mA |
| Package | 8-lead LFCSP, 3 × 2 mm |
Product Overview
The AD8317ACPZ-R7 is a compact wideband logarithmic detector/controller that extends useful RF power detection from 1 MHz to 10 GHz. Its progressive-compression architecture provides a decibel-scaled output and supports both measurement and closed-loop RF power-control applications.
The part’s key selection point is bandwidth combined with fast response. Analog Devices specifies accurate logarithmic conformance through 8 GHz, useful operation to 10 GHz, and a 55 dB input range with less than ±3 dB error through 8 GHz. Pulse response of approximately 6 ns falling and 10 ns rising makes it suitable for fast RF-burst detection where slower power detectors would average away the event.

Technical Specifications
| Parameter | Confirmed Information |
|---|---|
| Detector type | Demodulating logarithmic amplifier |
| Frequency range | 1 MHz to 10 GHz useful operation |
| Accurate logarithmic range | To 8 GHz |
| Dynamic range | 55 dB with <±3 dB error through 8 GHz |
| High-accuracy behavior | ±1 dB over documented range and temperature |
| Log slope | Approximately -22 mV/dB |
| Pulse response | 6 ns / 10 ns fall/rise |
| Supply voltage | 3.0 V to 5.5 V |
| Supply current | 22 mA |
| Disabled current | About 200 µA |
| Operating temperature | -40°C to +85°C |
| Package | 8-lead LFCSP, 3 × 2 × 0.75 mm with exposed pad |
| Product status | Production |
Design Considerations
The useful 10 GHz headline should not be confused with uniform log accuracy to 10 GHz. For calibrated power measurement above 8 GHz, review the exact frequency-dependent error and intercept curves rather than applying lower-frequency calibration constants unchanged.
Fast response also increases output-noise bandwidth. Choose any external output filtering from the required burst response and measurement noise floor together; excessive filtering removes the speed advantage, while too little filtering can degrade ADC stability.
Related Engineering Resources
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Third-party inspection or testing can be arranged according to customer requirements. Testing fees are borne by the buyer. Additional verification requirements can be discussed before shipment. After an order is placed, physical product, label, packaging, and Date Code photos may be provided where appropriate.
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